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產品內容
| Calibration Substrate Selection Guide | ||||||
| Calibration | Pad Size(microns) | Calibration | Footprint | Pitch Range | Pitch Range | |
| Substrate | Types Supported | Recommeded (µm) | Acceptable (µm) | |||
| CS-5 | 50 x 50 | SOLT, LRL, LRM | GSG | 75 - 250 | 75 - 250 | |
| CS-9 | 100 x 100 | SOLT, LRL, LRM | GSG | 250 - 600 | 150 - 600 | |
| CS-10 | 150 x 150 | SOLT, LRM | GSG | 600 -1250 | 225 -1250 | |
| CS-18 | 300 x 300 | SOLT, LRM | GSG | 1250 - 2540 | 500 - 2540 | |
| Figure 2 | ||||||
| CS-8 | 50 x 50 | SOLT, LRM | GS, SG | 50 - 200 | 50 - 300 | |
| 100 x 100 | ||||||
| 150 x 150 | ||||||
| CS-14 | 100 x 100 | SOLT, LRM | GS, SG | 200 - 400 | 150 - 600 | |
| CS-11 | 150 x 150 | SOLT, LRM | GS, SG | 400 - 1250 | 175 - 1250 | |
| CS-17 | 300x300 | SOLT, LRM | GS, SG | 750-2540 | 450-2540 | |
| Figure 3 | ||||||
| Special Calibration Substrate Designed For Use Above 110 GHz | ||||||
| CS-15 | 25 x 25 | SOLT, LRL, LRM | GSG | 40 - 150 (SOLT) | 40 - 150 | |
| 30 - 150 | ||||||
| (LRL) | ||||||
| Table 3 | ||||||
| SOLT = Short-Open-Load-Through | ||||||
| LRL = Line-Reflect-Line (Which is equivalent to TRL = Through-Reflect-Line) | ||||||
| LRM = Line-Reflect-Match (Which is equivalent to TRM = Through-Reflect-Match) | ||||||
| Accurate, easy to use calibration substrates, calibration coefficients, and detailed instructions allow you to precisely calibrate the measurement system to the probe tips. | ||||||
| The typical elements for calibrating a microwave measurement system consists of opens, shorts, 50 ohm loads, and throughs. Precision crafted calibration substrates, when properly used, assure you of accurate on-wafer test results. | ||||||
| All load standards are individually inspected and trimmed to within 0.25% accuracy using NIST traceable equipment. | ||||||
| Easy to use step by step instructions are provided for use with Agilent ENA four port network analyzers and Agilent PNA network analyzers with PLTS software. | ||||||
| Differential Calibration Substrate Selection Guide | ||||||
| Calibration | Pad Size (microns) | Calibration | Footprint | Pitch | ||
| Substrate | Types Supported | |||||
| CS-2100 | 50 x 50 | SOLT, LRL, LRM | GSGSG | 100 | 半導體製程精密零件 | |
